Atomic force microscope 43-ATM100
Atomic force microscope comes with combined design of scan head and sample stage so as to give strong anti-vibration performance. It's equipped with precision laser detection and probe alignment device for simple & easy adjustment of laser beam.
| Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle |
| Scan angle | Random angle |
| Maximum scan range | X/Y axis: 20 µm, Z axis: 2 µm |
| Optical system/ Magnification of CCD | Magnification: 4x, Resolution: 2.5 µm |
| Resolution | X/Y axis: 0.2 nm, Z axis: 0.05 nm |
| Sample size | Ø≤ 90 mm, H≤ 20 mm |
| Sample movement | 0 to 20 mm |
| Pulse width of approaching motor | 10 ± 2 ms |
| Scan rate | 0.6 Hz to 4.34 Hz |
| Scanning control | XY: 18 bit D/A & double 16 bit A/D multiple channel simultaneously |
| Types of sampling pixel | 256×256, 512×512 |
| Feedback type | DSP digital feedback |
| Feedback sampling rate | 64 KHz |
| PC connections: | USB 2.0 |
| Windows software | Compatible with windows 98/2000/XP/7/8 |
| Instrument Diemnsion | 415 × 410 × 545 mm |
| Net weight | 40 kg |
| Gross Weight | 50 kg |
- Large range of sample transfer
- Modular electronic system for easy maintenance
- Adopted with spring for vibration isolation
- Provides highly accurate results
- Optical observation system for checking tip & sample's position
It finds best solution for applications in biochemistry for tissues, cells, cellular components imaging, nanotechnology for imaging of polymers, nanomaterials, and in chemistry physics for imaging of surface metals elements.
