Atomic force microscope 43-ATM100

Atomic force microscope comes with combined design of scan head and sample stage so as to give strong anti-vibration performance. It's equipped with precision laser detection and probe alignment device for simple & easy adjustment of laser beam.

Specifications :

Operation modes	Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle
Scan angle	Random angle
Maximum scan range	X/Y axis: 20 µm, Z axis: 2 µm
Optical system/ Magnification of CCD	Magnification: 4x, Resolution: 2.5 µm
Resolution	X/Y axis: 0.2 nm, Z axis: 0.05 nm
Sample size	Ø≤ 90 mm, H≤ 20 mm
Sample movement	0 to 20 mm
Pulse width of approaching motor	10 ± 2 ms
Scan rate	0.6 Hz to 4.34 Hz
Scanning control	XY: 18 bit D/A & double 16 bit A/D multiple channel simultaneously
Types of sampling pixel	256×256, 512×512
Feedback type	DSP digital feedback
Feedback sampling rate	64 KHz
PC connections:	USB 2.0
Windows software	Compatible with windows 98/2000/XP/7/8
Instrument Diemnsion	415 × 410 × 545 mm
Net weight	40 kg
Gross Weight	50 kg

Features : Large range of sample transfer Modular electronic system for easy maintenance Adopted with spring for vibration isolation Provides highly accurate results Optical observation system for checking tip & sample's position

Software Features : 2 types of sampling pixel for selection (256x256, 512x512) Selection of an area of interest for sampling by executing scan area move and cut function Scans sample in random angle at beginning Adjustment of laser spot detection system in real time Selection and setting for different color scanning images in palette Supports linear average and offset calibration in real time for sample title Supports scanner sensitivity calibration and electronic controller auto-calibration Supports offline analysis and process of sample image

Applications : It finds best solution for applications in biochemistry for tissues, cells, cellular components imaging, nanotechnology for imaging of polymers, nanomaterials, and in chemistry physics for imaging of surface metals elements.

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