Spectrometer
Atomic Fluorescence Spectrometer 60-AFS100
Beam Configuration : Dual Channel
Elements ( Measuring Range ) :
Precision ( RSD ) : < 1.0
Linear range : More than 3 orders of magnitude
Elements ( Measuring Range ) :
| As, Se, Pb, Bi, Sb, Te, Sn | < 0.01 µg/L |
| Hg, Cd | < 0.001 µg/L |
| Zn | < 1.0 µg/L |
| Ge | < 0.1 µg/L |
Linear range : More than 3 orders of magnitude
FTIR Spectrometer 60-FTI101
Spectral Range : 7800 to 350cm-1
Resolution : Better than 0.85cm-1
Wave number Precision : ± 0.01cm-1
Scanning Speed : 5-step adjustable
Resolution : Better than 0.85cm-1
Wave number Precision : ± 0.01cm-1
Scanning Speed : 5-step adjustable
ICP spectrometer 60-ICP100
Wavelength range ( 3600 lines / mm ) : 180 to 500 nm
Wavelength range ( 2400 lines / mm ) : 180 to 800 nm
Temperature : 20 ~ 28 °C
Elements per minute : 26 elements
Wavelength range ( 2400 lines / mm ) : 180 to 800 nm
Temperature : 20 ~ 28 °C
Elements per minute : 26 elements
ICP Spectrometer 60-ICP102
Wavelength range : 195 to 800 mm
Elements per minute : 10 elements
Temperature range : 32 °C
Incident slit : 20 µm
Elements per minute : 10 elements
Temperature range : 32 °C
Incident slit : 20 µm
XRF-Spectrometer 60-XRF100
Measureable elements : S to U
Detection limit : 1 ppm
Temperature : 15 ~ 30 °C
Elemental content : 1 ppm to 99 %
Detection limit : 1 ppm
Temperature : 15 ~ 30 °C
Elemental content : 1 ppm to 99 %
ICP Spectrometer 60-ICP101
Wavelength range : 180 to 900 nm
Elements per minute : 15 elements
Temperature : 29 °C
Incident slit : 25 µm
Elements per minute : 15 elements
Temperature : 29 °C
Incident slit : 25 µm