Atomic force microscope 43-ATM101
Atomic force microscope comes with combined design of scan head and sample stage, to give strong anti-vibration performance. Adopted with servomotor, drives the sample approaching tip manually or automatically, to evaluate precise scanning area position. Equipped with precision laser detection and probe alignment device, make easy adjustment of laser beam.
| Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scan angle 0 to 360° |
| Scan angle | 0 to 360° |
| Maximum scan range | X/Y axis: 50 µm, Z axis: 5 µm |
| Optical system/ Magnification of CCD | Magnification: 10x, Resolution: 1 µm |
| Resolution | X/Y axis: 0.2 nm, Z axis: 0.05 nm |
| Sample size | Ø≤ 90 mm, H≤ 20 mm |
| Sample movement | 0 to 20 mm |
| Pulse width of approaching motor | 10 ± 2 ms |
| Scan rate | 0.6 Hz to 4.34 Hz |
| Scanning control | XY: 18 bit D/A & double 16 bit A/D multiple channel simultaneously |
| Types of sampling pixel | 256×256, 512×512 |
| Feedback type | DSP digital feedback |
| Feedback sampling rate | 64 KHz |
| PC connections: | USB 2.0 |
| Windows software | Compatible with windows 98/2000/XP/7/8 |
| Instrument Diemnsion | 700 × 500 × 460 mm |
| Net weight | 50 kg |
| Gross Weight | 87.4 kg |
- Large sample transfer range
- Optical observation system for checking tip & sample's position
- Modular electronic system for easy maintenance
- CCD observing system
- Equipped with servomotor to achieve CCD auto focusing
- Provides highly accurate results
It finds best solution for applications in biochemistry for tissues, cells, cellular components imaging, nanotechnology for imaging of polymers, nanomaterials, and in chemistry physics for imaging of surface metals elements.
